NXP N-AFE RTD (Resistance temperature detector)/PTC/NTC

NXP N-AFE Resistance Temperature Detector

  Configuration NAFE Other Solutions
Number of RTDS per chip 2 Wires 8 4
3 Wires 4 2
4 Wires 3 2

NAFE Benefits:

  • Optimized number of RTDs per chip in any wiring configuration
  • Software configurable for 2-3-4 wires without hardware changes
  • Integrated low leakage protections
  • ±5ppm/ ˚C temperature drift over 165°C

Calibrated vs non-calibrated (LC)

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Calibrated vs non-calibrated accuracy in RTD

Symbol Parameter Conditions Min Typ Max Unit
TUE_AT Total unadjusted error at room[1]

Initial accuracy after user calibration, TA = +40 °C 

TUE[V/V]=(OE+GEv+INL)/FS

   +0.002 +0.005 % FS

Initial accuracy with factory calibration, TA = +40 °C 

TUE[V/V]=(OE+GEv+INL)/FS

  

+0.06

 +0.15

 

Full Scale range: 0.3125 V

Accuracy User CAL= ± 6.3 µV

Accuracy FACTORY = ± 187 µV

 

IEXC= 1mA, Pt100

Accuracy User CAL= ± 0.00625 Ω

Accuracy FACTORY = ± 0.1875 Ω

 

Accuracy User CAL= ±  0.02 °C

Accuracy FACTORY = ±  0.49 °C

Overview

NXP N-AFE Overview

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