NXP N-AFE RTD (Resistance temperature detector)/PTC/NTC
| Configuration | NAFE | Other Solutions | |
|---|---|---|---|
| Number of RTDS per chip | 2 Wires | 8 | 4 |
| 3 Wires | 4 | 2 | |
| 4 Wires | 3 | 2 |
NAFE Benefits:
- Optimized number of RTDs per chip in any wiring configuration
- Software configurable for 2-3-4 wires without hardware changes
- Integrated low leakage protections
- ±5ppm/ ˚C temperature drift over 165°C
Calibrated vs non-calibrated accuracy in RTD
| Symbol | Parameter | Conditions | Min | Typ | Max | Unit |
|---|---|---|---|---|---|---|
| TUE_AT | Total unadjusted error at room[1] |
Initial accuracy after user calibration, TA = +40 °C TUE[V/V]=(OE+GEv+INL)/FS |
+0.002 | +0.005 | % FS | |
|
Initial accuracy with factory calibration, TA = +40 °C TUE[V/V]=(OE+GEv+INL)/FS |
+0.06 |
+0.15 |
Full Scale range: 0.3125 V
Accuracy User CAL= ± 6.3 µV
Accuracy FACTORY = ± 187 µV
IEXC= 1mA, Pt100
Accuracy User CAL= ± 0.00625 Ω
Accuracy FACTORY = ± 0.1875 Ω
Accuracy User CAL= ± 0.02 °C
Accuracy FACTORY = ± 0.49 °C
Overview
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