STMicroelectronics STGAP4S
STGAP4S - Automotive advanced isolated gate driver for IGBTs and SiC MOSFETs
The STGAP4S is a galvanically isolated single gate driver for IGBTs and SiC MOSFETs with advanced protection, configuration and diagnostic features. The architecture of the STGAP4S isolates the channel gate driving from the control and the low voltage interface circuitry through true galvanic isolation.
The unique output architecture is designed to allow the use of an external MOSFET push-pull stage giving flexibility in terms of current capability dimensioning and easing the use of several power switches in parallel. The 2 pre-driver outputs are characterized by current capability and output voltage swing optimized for that topology and allow the use of a negative gate driving supply.
The integrated controller for isolated flyback power supply allows to generate positive and negative gate driver supply voltages with few external components, enabling PCB space saving.
Protection functions such as the Miller clamp driver, desaturation and overcurrent detection, UVLO and OVLO are included to easily design high reliability systems.
A temperature sensor is integrated in the driver.
Open drain diagnostic outputs are present and detailed device conditions can be monitored through the SPI. Each function’s parameter can be programmed via the SPI, making the device very flexible and allowing it to fit in a wide range of applications.
Features
- AEC-Q100 qualified
- Qualified according to ISO 26262 targeting applications up to ASIL D
- Documentation to support system design up to ASIL D available upon request
- Embedded check functions for latent faults detection ease system ASIL rating
- High voltage rail up to 1200 V
- Two output pins for direct driving of external MOSFET buffer
- Driver current capability:
- OUT1: 0.6/2.5 A sink/source
- OUT2: 2.4/0.6 A sink/source
- Negative gate drive ability
- dV/dt transient immunity ±100 V/ns in full temperature range
- Integrated controller for isolated flyback power supply
- Active Miller clamp driver for external N‑channel MOSFET
- Programmable Desaturation detection
- Programmable Overcurrent detection
- Soft turn-off
- VCE active clamp
- Two diagnostic status outputs
- Programmable UVLO and OVLO on each supply
- Programmable input deglitch filter
- Asynchronous stop command
- Isolated 8-bit A/D converter
- Integrated temperature sensor
- Programmable deadtime, with violation error
- SPI interface for parameters programming and extended diagnostic
- Temperature warning and shutdown protection
Applications
- Inverters for EV/HEV
- 600/1200 V industrial inverters
- EV charging stations
- UPS equipment
- AC/AC converters
- DC/DC converters
- Solar inverters
EVALSTGAP4S - Demonstration board for STGAP4S advanced galvanically isolated gate driver
The EVALSTGAP4S is a galvanically isolated single gate driver for IGBTs and SiC MOSFETs with advanced protection, configuration, and diagnostic features. The architecture of the STGAP4S isolates the channel gate driving from the control and the low voltage interface circuitry through a true galvanic isolation.
The EVALSTGAP4S board allows evaluating all the STGAP4S features while driving a power switch with a voltage rating up to 650 V. The board is provided with two SiC MOSFETs in a H2PAK-7 package connected in half-bridge configuration. The two STGAP4S drivers are connected in an SPI daisy chain and the high voltage side of each is fed by its own flyback power supply, whose controller is integrated in the driver.
Multiple boards can be connected and share the same logic supply voltage in order to evaluate complex topologies, such as full-bridge inverter. The connection of multiple boards allows the implementation of the SPI daisy chain with more than two devices.
In combination with the STEVAL-PCC009V2 and STSW-STGAP4 GUI, the board allows to easily enable, configure, or disable all of the driver's protection and control features through the SPI interface. Advanced diagnostic is also available thanks to the driver's status registers that can be accessed through the SPI.
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