Microchip RT4G150

RTG4 FPGAs integrate Microchip's fourth-generation flash-based FPGA fabric and high-performance interfaces such as serialization/deserialization (SERDES) on a single chip while maintaining the resistance to radiation-induced configuration upsets in the harshest radiation environments, such as space flight (LEO, MEO, GEO, HEO, deep space); high altitude aviation, medical electronics, and nuclear power plant control.

Hermetically-sealed packages for space applications (CQFP, CCGA/LGA) and plastic package for newspace satellite constellations.

Key features

• Highly reliable, nonvolatile re-programmable flash technology
• 150k Logic Elements (LEs)
• 5 Mbits SRAM
• 462 multipliers
• Configuration memory upsets immunity
• Single-event latch-up (SEL) immunity to LET > 103 MeV.cm2/mg
• SEU-hardened registers eliminate the need for triple-module redundancy (TMR)
• Immune to single-event upsets (SEU) to LET > 37 MeV.cm2/mg
• SEU rate < 10–12 errors/bit-day (GEO Solar Min)
• SRAM has a built-in error detection and correction (EDAC)
• Upset rate < 10–11 errors/bit-day (GEO Solar Min)
• Single error correction and double error detection (SECDED)
• Single-event transient (SET) upset rate < 10–8 errors/bit-day (GEO Solar Min) with optional SET filter
• Total ionizing dose (TID) > 100 krad