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EBV & Micron – Expert Round Up
No question remains unanswered!

 

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The Information Age

We live in the Information Age. With the proliferation of new digital storage technologies, the amount of globally stored information exploded, reaching staggering 59 zettabytes in 2020. Fast access to a vast amount of information laid the foundations for new concepts such as Industry 4.0, enabling new business models and more efficient use of our limited resources. However, these emerging concepts bring new challenges for the storage media manufacturers, demanding robust performance and high endurance in a smaller form factor.

Micron's 2100 AI/AT SSDs: Reliable solution for emerging applications

Micron, one of the world's largest and most innovative memory and storage manufacturers, recently introduced the 2100 AI/AT series SSDs, combining the benefits of the low-latency PCIe®/NVMe™ interface and the 64-layer Triple-Level Cell (TLC) 3D NAND technology. The 2100 AI/AT series SSDs are designed to withstand harsh conditions in the industrial and automotive environment while delivering robust performance in a small M.2 or BGA form factor. By providing a rich set of performance, reliability, and security features, Micron's 2100 AI/AT SSDs represent a perfect storage solution and a firm basis for emerging applications in industrial and automotive segments.

Information is everything - especially if it's easily accessible!

Information is the basis of modern society. With the right information, you can avoid possible roadblocks in your design and reduce time to market. In our relentless pursuit of valuable information, we at EBV teamed up with SSD experts from Micron and recorded a series of video interviews, hoping to share them with you. Micron's experts explained what distinguishes their SSD solutions from the competition, revealing some interesting details about the technology behind their innovative 2100AI/AT series SSDs for industrial and automotive applications. With the uncertainty out of the way, you will be able to achieve your development goals with great confidence!

 

These are some of the questions we asked:

  • What are the key benefits of Micron's industrial-grade PCIe NVMe SSDs? Can you please explain in more detail?
  • Can you please explain the advanced implementations of data protection and data integrity in power failure events?
  • SATA is becoming obsolete, while the capacities of the NVMe devices increase exponentially. Can you tell us more about this?
  • How does a small form-factor of both M.2 devices and BGA NVMe chips provide benefit to the emerging edge computing platforms?
  • Is there AEC-Q100 or similar automotive qualification related to Micron SSD 2100 series?
  • ​How does Micron 2100AI/AT SSD manage to support operating under wide temperature variations in automotive and industrial environments while still delivering reliable performance?

 

 


Meet the experts from Micron
 

 

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Gerhard Risse - Field Application Engineer

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Taufique Ahmed – Senior Manager

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Gil Golov - Senior Manager & Principal ADAS Architect

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In this first preview video, Gerhard Risse, a field application engineer (FAE) from Micron, explains the key benefits of 2100AI/AT series SSDs. He talks about how 2100AI/AT SSDs can be fine-tuned for better performance, reliability, and durability, using the advanced features these SSDs provide, such as mixed namespace configurations with arbitrary SLC/TLC allocation. His explanations are supported by several examples of using this feature to achieve the customers' application-specific requirements very effectively.

 

 


 

Q1 & Q2

In this session, Tafique Ahmed, Senior Manager of the Industrial Segment, explains why Micron deviated from the well-trodden path of using SATA drives in industrial storage applications and decided to implement a newer PCIe NVMe solution on their 2100AI/AT series industrial and automotive SSDs. He also highlights the benefits of small form factor M.2 and BGA SSD solutions for various types of space-constrained applications, such as Edge computers in Industry 4.0, explaining the main advantages of both solutions when a compromise between scalability and reliability is required over a wide range of use cases.

 

 

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Taufique Ahmed - holds a Bachelor of Engineering degree in Electrical and Electronics Engineering and has been in many marketing positions for more than 30 years. Currently Taufique holds a position as a Senior Manager at Micron Technology covering the Industrial Multi-Market (IMM) Segment.

 


 

 

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Gerhard Risse - Field Application Engineer at Micron, working with Industrial Customers in EMEA. Gerhard has more than 20 years of experience in R&D and customer phasing engineering roles. He holds a Master's Degree in Electrical Engineering from Karlsruhe Institute of Technology (KIT).

Q3:

Unexpected power loss is a critical event that plagues many different storage devices regardless of how advanced they are. In such an event, data transfer is abruptly interrupted. Without a proper handling mechanism, the storage drive might start behaving unpredictably and even corrupt pre-existing data (e.g., leaving the file open while writing garbage data). Fortunately, NVMe 1.3 protocol implements mechanisms that prevent such failures. However, to ensure the highest level of reliability and compliance with the most stringent requirements, Micron engineers have implemented yet another level of protection in the form of an additional shutdown mechanism that acts much faster than the typical NVMe implementation, ensuring no data corruption occurs during power loss events. In this session, Gerhard Risse, an FAE from Micron, reveals some details about their improved data protection implementation against power loss.

 


 

 

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Gil Golov - Senior Manager & Principal Automotive Architect, managing Micron's Embedded Business Unit's automotive system architecture team. Prior to working for Micron, Gil spent more than 15 years in various chip design R&D roles. He holds a Bachelor of Science in electronics from Tel Aviv University and a Master of Science in microelectronics from Brunel University (UK). Gil holds 26 patents.

Q5 & Q6:

Many deteriorating factors in the automotive and industrial environment shorten the lifespan of the equipment. Storage devices are notoriously sensitive to all types of stress conditions that can be found in abundance in such environments, including excessive electromagnetic interference, elevated operating temperatures, high G-force, excessive vibration, and more. To ensure reliable operation, devices used in industrial and automotive applications must meet a set of stringent specifications standardized by the Automotive Electronics Council. In this session, Gil Golov, Senior Manager, Principal Automotive Architect, gives us some insights into the AEC standards covered by Micron's 2100 AI/AT SSDs and explains how these otherwise sensitive storage devices manage to meet such stringent standards in harsh environments.